Electrical Characterization of Thin Layer Materials: Destructive and Non-Destructive Irreversible Processes in Langmuir Films
Electrical Characterization of Thin Layer Materials: Destructive and Non-Destructive Irreversible Processes in Langmuir Films
Author(s): Drahoslav Barančok, Július Cirák, Pavol Tomčík, Ján Vajda, Martin WeisSubject(s): Energy and Environmental Studies, Methodology and research technology
Published by: Žilinská univerzita v Žilině
Keywords: Thin Layer Materials; monolayers; Maxwell displacement current (MDC);
Summary/Abstract: Well-defined Langmuir-Blodgett films prepared by reproducible technique are still highly attractive for exploitation in investigation of subjects as diverse as chain packing, phase transitions, two-dimensional physics, biosensors and membrane physics. During last 15 years the Maxwell displacement current (MDC) measuring technique was developed for dynamic study of monolayers. In experiment MDC flows through the metal electrode/air gap/Langmuir monolayer/water surface structure. Spontaneous formation of the monolayer was observed and significant differences between destructive and non-destructive processes are discussed.
Journal: Komunikácie - vedecké listy Žilinskej univerzity v Žiline
- Issue Year: 8/2006
- Issue No: 1
- Page Range: 10-12
- Page Count: 3
- Language: English